The WD 500 GB hard disk (2013 vintage) on which I kept OpenSUSE started misbehaving and stopped booting. It is/was GPT partitioned with MBR loaded 42.2, 42.3 and 15. I got a 250 GB SSD and installed Leap 15 afresh. The old disk is readable and I have recovered all the data. So that is not a problem.
When I checked the drive on the partitioner I found that the descriptions of the partitions had changed! What I figure is that the MBR partition table got corrupt. I wonder if I could reformat the disk either as complete GPT or Legacy MBR and use it as non-booting non-critical data storage. I ran smartctl and the output is as under :
linux-jpq8:~ # smartctl -a /dev/sdh
smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.12.14-lp150.12.16-default] (SUSE RPM)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: WDC WD5000AZRX-00A8LB0
Serial Number: WD-WCC1U4596684
LU WWN Device Id: 5 0014ee 208eed889
Firmware Version: 01.01A01
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 1.5 Gb/s)
Local Time is: Tue Aug 21 18:04:39 2018 IST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 8160) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 95) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x30b5) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 144 122 021 Pre-fail Always - 3775
4 Start_Stop_Count 0x0032 093 093 000 Old_age Always - 7068
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 6
9 Power_On_Hours 0x0032 087 087 000 Old_age Always - 9984
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 093 093 000 Old_age Always - 7059
192 Power-Off_Retract_Count 0x0032 190 190 000 Old_age Always - 7527
193 Load_Cycle_Count 0x0032 133 133 000 Old_age Always - 202188
194 Temperature_Celsius 0x0022 103 094 000 Old_age Always - 40
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
Warning: ATA error count 35885 inconsistent with error log pointer 1
ATA Error Count: 35885 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 35885 occurred at disk power-on lifetime: 9979 hours (415 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 53 4f c2 e0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d8 00 00 4f c2 e0 00 00:12:31.593 SMART ENABLE OPERATIONS
c6 00 10 00 00 00 a0 00 00:12:30.642 SET MULTIPLE MODE
ef 03 0c 00 00 00 a0 00 00:12:30.627 SET FEATURES [Set transfer mode]
b0 da 00 00 4f c2 e0 00 00:12:20.339 SMART RETURN STATUS
b0 d8 00 00 4f c2 e0 00 00:12:18.628 SMART ENABLE OPERATIONS
Error 35884 occurred at disk power-on lifetime: 9979 hours (415 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 53 4f c2 e0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d8 00 00 4f c2 e0 00 00:12:18.628 SMART ENABLE OPERATIONS
ec 00 00 00 00 00 a0 00 00:12:18.627 IDENTIFY DEVICE
Error 35883 occurred at disk power-on lifetime: 9977 hours (415 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 02 00 00 00 00 a0 00 01:03:38.433 SET FEATURES [Enable write cache]
f5 00 00 00 00 00 a0 00 01:03:38.433 SECURITY FREEZE LOCK
ef 66 00 00 00 00 a0 00 01:03:38.433 SET FEATURES [Disable revert defaults]
c6 00 00 00 00 00 a0 00 01:03:36.847 SET MULTIPLE MODE
ef 03 0c 00 00 00 a0 00 01:03:36.847 SET FEATURES [Set transfer mode]
Error 35882 occurred at disk power-on lifetime: 9977 hours (415 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
f5 00 00 00 00 00 a0 00 01:03:38.433 SECURITY FREEZE LOCK
ef 66 00 00 00 00 a0 00 01:03:38.433 SET FEATURES [Disable revert defaults]
c6 00 00 00 00 00 a0 00 01:03:36.847 SET MULTIPLE MODE
ef 03 0c 00 00 00 a0 00 01:03:36.847 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 01:03:35.840 IDENTIFY DEVICE
Error 35881 occurred at disk power-on lifetime: 9977 hours (415 days + 17 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 00 00 00 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ef 66 00 00 00 00 a0 00 01:03:38.433 SET FEATURES [Disable revert defaults]
c6 00 00 00 00 00 a0 00 01:03:36.847 SET MULTIPLE MODE
ef 03 0c 00 00 00 a0 00 01:03:36.847 SET FEATURES [Set transfer mode]
ec 00 00 00 00 00 a0 00 01:03:35.840 IDENTIFY DEVICE
ef 03 0c 00 00 00 00 00 01:02:56.233 SET FEATURES [Set transfer mode]
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 9918 -
# 2 Short offline Completed without error 00% 9912 -
# 3 Short offline Completed without error 00% 9907 -
# 4 Short offline Completed without error 00% 9898 -
# 5 Short offline Completed without error 00% 9885 -
# 6 Short offline Completed without error 00% 9877 -
# 7 Short offline Completed without error 00% 9872 -
# 8 Short offline Completed without error 00% 9866 -
# 9 Short offline Completed without error 00% 9861 -
#10 Short offline Completed without error 00% 9856 -
#11 Extended offline Completed without error 00% 9853 -
#12 Short offline Completed without error 00% 9847 -
#13 Short offline Completed without error 00% 9843 -
#14 Short offline Completed without error 00% 9837 -
#15 Short offline Completed without error 00% 9832 -
#16 Short offline Completed without error 00% 9825 -
#17 Short offline Completed without error 00% 9822 -
#18 Short offline Completed without error 00% 9814 -
#19 Short offline Completed without error 00% 9808 -
#20 Short offline Completed without error 00% 9804 -
#21 Short offline Completed without error 00% 9792 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Can anyone conversant with the meaning of the output advise me if the drive is usable? And where can I find documentation to learn to understand the output?
Thanks.
PrakashC