Hi,
I have had my share of misfortune in what concerns hardware.
But in all this years (many many years … ) one thing I was very very fortunate about, bad hdd’s.
So far I only had two problems and even those where on servers that run 24/7 during many years on data-centers …
But last week I using my 4 hdd 4TB Raid 10 Sofware and Encrypted Raid when I decided to enable smartd … errors where reported …
Yup!
I made a normal install of Linux on a Flash USB, then took an older MB + Box that I had lying around and installed there 4 1TB Hitashi hdd’s.
As soons as they arived they where big problems.
One hdd did not even got recognized by the bios, I returned it and then they gave me a new one.
Last week the problem was smart diagnotics.
smartctl -a /dev/sdb gave 12 errors, all relating to bad sectors.
The problem is that I think the disk did not report any errors prior to that usage …
Now it only indicates de error messages but nothing else really occurred …
Also this is on hdd in a RAID 10 setup.
I created the raid,.that is:
1- Formated all disk to sustain a RAID partition.
2- Created the raid lvel 10 with the 4 devices.
3- Encrypted the raid partition … a long process … one and a half week of writing random data on it …
And now I have a Raid 10 2TB encrypted partition that I mount after booting …
The actuall system is a Ubuntu 9.04 that boots from flash USB pen.
My problem is what should I do with the hdd ?
I do not have any tools from the vendor that I can use.
Any advice ?
Output of smartctl is this:
sudo smartctl -a /dev/sdb
[sudo] password for samp:
smartctl version 5.38 [x86_64-unknown-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HDT721010SLA360
Serial Number: STF605MH2DWPMK
Firmware Version: ST6OA31B
User Capacity: 1,000,204,886,016 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Mon Nov 2 21:32:32 2009 WET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (14090) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 235) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 098 098 016 Pre-fail Always - 262145
2 Throughput_Performance 0x0005 130 130 054 Pre-fail Offline - 122
3 Spin_Up_Time 0x0007 121 121 024 Pre-fail Always - 465 (Average 484)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 51
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 8
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 123 123 020 Pre-fail Offline - 34
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 246
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 51
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 54
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 54
194 Temperature_Celsius 0x0002 150 150 000 Old_age Always - 40 (Lifetime Min/Max 25/51)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 12
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 12 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 12 occurred at disk power-on lifetime: 126 hours (5 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0f 30 bd 1e e9 Error: UNC 15 sectors at LBA = 0x091ebd30 = 153009456
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f b9 1e e0 08 00:39:47.900 READ DMA EXT
27 00 00 00 00 00 e0 08 00:39:47.900 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 0a 00:39:47.800 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 0a 00:39:47.800 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 00:39:47.800 READ NATIVE MAX ADDRESS EXT
Error 11 occurred at disk power-on lifetime: 126 hours (5 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0f 30 bd 1e e9 Error: UNC 15 sectors at LBA = 0x091ebd30 = 153009456
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f b9 1e e0 08 00:39:43.400 READ DMA EXT
27 00 00 00 00 00 e0 08 00:39:43.400 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 0a 00:39:43.400 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 0a 00:39:43.400 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 00:39:43.400 READ NATIVE MAX ADDRESS EXT
Error 10 occurred at disk power-on lifetime: 126 hours (5 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0f 30 bd 1e e9 Error: UNC 15 sectors at LBA = 0x091ebd30 = 153009456
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f b9 1e e0 08 00:39:39.000 READ DMA EXT
27 00 00 00 00 00 e0 08 00:39:39.000 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 0a 00:39:39.000 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 0a 00:39:39.000 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 00:39:39.000 READ NATIVE MAX ADDRESS EXT
Error 9 occurred at disk power-on lifetime: 126 hours (5 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0f 30 bd 1e e9 Error: UNC 15 sectors at LBA = 0x091ebd30 = 153009456
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f b9 1e e0 08 00:39:34.600 READ DMA EXT
27 00 00 00 00 00 e0 08 00:39:34.600 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 0a 00:39:34.600 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 0a 00:39:34.600 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 00:39:34.600 READ NATIVE MAX ADDRESS EXT
Error 8 occurred at disk power-on lifetime: 126 hours (5 days + 6 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 0f 30 bd 1e e9 Error: UNC 15 sectors at LBA = 0x091ebd30 = 153009456
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f b9 1e e0 08 00:39:30.100 READ DMA EXT
27 00 00 00 00 00 e0 08 00:39:30.100 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 0a 00:39:30.100 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 0a 00:39:30.100 SET FEATURES [Set transfer mode]
27 00 00 00 00 00 e0 08 00:39:30.100 READ NATIVE MAX ADDRESS EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Regards,
Pedro